Patent Quality: Towards a Systematic Framework for Analysis and Measurement

Working Paper: NBER ID: w27598

Authors: Kyle W. Higham; Gatan de Rassenfosse; Adam B. Jaffe

Abstract: The 'quality' of novel technological innovations is extremely variable, and the ability to measure innovation quality is essential to sensible, evidence-based policy. Patents, an often vital precursor to a commercialised innovation, share this heterogeneous quality distribution. A pertinent question then arises: How should we define and measure patent quality? Accepting that different stakeholders have different views of this concept, we take a multi-dimensional view of patent quality in this work. We first test the consistency of popular post-grant outcomes that are often used as patent quality measures. Finding these measures to be generally inconsistent, we then use a raft of patent indicators that are defined at the time of grant to dissect the characteristics associated with different post-grant outcomes. We find broad disagreement in the relative importance of individual characteristics between outcomes and, further, significant variation of the same across technologies within outcomes. We conclude that measurement of patent quality is highly sensitive to both stakeholder viewpoint and technology type. Our findings bear implications for scholarly research using patent data as well as for policy discussions about patent quality.

Keywords: patent quality; innovation measurement; post-grant outcomes

JEL Codes: O31; O34


Causal Claims Network Graph

Edges that are evidenced by causal inference methods are in orange, and the rest are in light blue.


Causal Claims

CauseEffect
patent characteristics (O34)post-grant outcomes (O38)
patent characteristics (O34)patent quality measures (L15)
different technologies (O33)characteristics associated with post-grant outcomes (I23)
post-grant outcomes (O38)patent quality measures (L15)
stakeholder viewpoints + technology types (O36)measurement of patent quality (O34)
different patent metrics (O34)conflicting assessments of patent quality (L15)
composite indicators (C43)obscured research questions (C90)

Back to index